Patent assignee · DE · COMPANY

ABBERIOR INSTRUMENTS GMBH

🏢 View company profile →
22Patents
22Active
22Granted
58Portfolio score

Filing activity: Nov 4, 2015 → Mar 18, 2024

Most-cited patents

PatentTitleAreaCited byStatus
US9645376B1 Scanner head and device with scanner head Physics 2 Active
US10386621B2 Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope Physics 1 Active
US11131630B2 Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system Physics 1 Active
US9632297B1 Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device Physics 1 Active
US10429305B2 Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers Physics 1 Active
US10795140B2 Method, device and laser scanning microscope for generating rasterized images Electricity 1 Active
US11774740B2 Apparatus for monitoring a focal state of microscope Physics 0 Active
US11493744B2 Methods and apparatuses for checking the confocality of a scanning and descanning microscope assembly Physics 0 Active
US12111455B2 Detecting movements of a sample with respect to an objective Physics 0 Active
US12306392B2 Method, apparatus and computer program for localizing an emitter in a sample Physics 0 Active
US10488342B2 Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers Physics 0 Active
US11933729B2 Method, computer program, and apparatus for adapting an estimator for use in a microscope Physics 0 Active
US12352943B2 Method and device for illuminating a sample in a microscope in points Physics 0 Active
US12055728B2 Method and light microscope for a high-resolution examination of a sample Physics 0 Active
US11598943B2 Fluorescence microscope with stabilized adjustment and group of components and module for upgrading a fluorescence microscope Physics 0 Active
US11947097B2 Bandpass filter for light having variable lower and upper cut-off wavelengths Physics 0 Active
US12216019B2 Apparatuses for testing the lateral and axial confocality of a scanning and descanning microscope component group Physics 0 Active
US12181413B2 Method, computer program, and apparatus for adapting an estimator for use in a microscope Physics 0 Active
US12259329B2 Method of disturbance correction, and laser scanning microscope having disturbance correction Physics 0 Active
US12265033B2 Method, computer program and apparatus for determining positions of molecules in a sample Physics 0 Active
US11967090B2 Method of and microscope comprising a device for detecting movements of a sample with respect to an objective Physics 0 Active
US11460618B2 Apparatus for selectively shaping phase fronts of a light beam, and use thereof Physics 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.