Memory device and program operation thereof
US11508441B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2021 |
| Grant date | Nov 22, 2022 |
| Priority date | — |
| Expiry date | May 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/0483
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In certain aspects, a memory device includes a first memory string including a first drain, a first drain select gate (DSG) transistor, first memory cells, and a first drain dummy transistor between the first drain and the first DSG transistor. The memory device also includes a first bit line coupled to the first drain, a first drain dummy line coupled to the first drain dummy transistor, a first DSG line coupled to the first DSG transistor, word lines respectively coupled to the first memory cells, and a peripheral circuit configured to perform a program operation on a target memory cell of the first memory cells coupled to a selected word line of the word lines. To perform the program operation, the peripheral circuit includes a bit line driver coupled to the first bit line and configured to apply a first bit line voltage to select the first bit line, and a word line driver coupled to the first drain dummy line and the first DSG line and configured to apply a DSG voltage to the first DSG line to turn on the first DSG transistor, and apply a drain dummy line voltage to the first drain dummy line to turn on the first drain dummy transistor. The drain dummy line voltage is greater t…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.