Calibration method and apparatus for measurement X-ray CT apparatus, measurement method and apparatus using the same, and measurement X-ray CT apparatus
US11510643B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2020 |
| Grant date | Nov 29, 2022 |
| Priority date | — |
| Expiry date | Jan 29, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Volume data is generated by performing a CT scan with a spherical calibration jig having known dimensions in contact with an object. A profile of the surface shape of the object in the volume data is obtained, and a boundary surface of the spherical calibration jig is calculated from the center coordinates of the spherical calibration jig. A correction value for adjusting a boundary surface of the object determined from the gradient of the profile to the boundary surface of the spherical calibration jig is determined, and the boundary surface of the object is corrected by using the correction value. The shape of the object is determined by using the corrected boundary surface. The precision of measurement X-ray CT can thus be increased by accurately detecting the boundary surface of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.