Method for in situ functionality testing of switches and contacts in semiconductor interface hardware
US11555856B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2019 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Sep 25, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3277
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for in situ functionality testing of electrical switches using a Functional Reflectometry Test (FRT) of switches on the signal path of electrical circuits in a semiconductor interface. The method includes initiating the functionality testing of the electrical switches in situ, wherein the functionality of the electrical switches is tested while the electrical switches are connected to the Automatic Test Equipment (ATE) and are in-use testing semiconductors. The method also includes conducting full Functional Reflectometry Testing of the electrical switches in situ in an open switch state and a closed switch state to determine whether each of the electrical switches is one of fully functional, stuck closed, and stuck open, wherein testing for each state is performed as a single vector functional test to minimize test time overhead.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.