Sensor alignment using homogeneous test mode
US11566926B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | May 3, 2021 |
| Grant date | Jan 31, 2023 |
| Priority date | — |
| Expiry date | Aug 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An alignment device may obtain a set of analog-to-digital converter (ADC) signals provided by an angle sensor operating in a homogeneous test mode. The set of ADC signals may be associated with a rotation of a target magnet relative to the angle sensor. The alignment device may identify a maximum ADC signal value based on the set of ADC signals. The alignment device may selectively position, by the alignment device, at least one of the angle sensor or the target magnet based on the maximum ADC signal value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.