Semiconductor device having micro-bumps and test method thereof
US11568950B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jul 1, 2020 |
| Grant date | Jan 31, 2023 |
| Priority date | — |
| Expiry date | May 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/1201
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor device includes a plurality of first micro-bumps suitable for transferring normal signals; a plurality of a second micro-bumps suitable for transferring test signals; and a test circuit including a plurality of scan cells respectively corresponding to the first and second micro-bumps. The test circuit is suitable for applying signals stored in the respective scan cells to the first and second micro-bumps, feeding back the applied signals from the first and second micro-bumps to the respective scan cells, and sequentially outputting the signals stored in the scan cells to a test output pad.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.