Electrical component testing method and test probe

US11573265B2 · kind B2 · utility

Assignee

• CHROMA ATE INC. · TW

Inventors

• Min-Hung Chang · Taoyuan, TW
• Ching-Lin Lee · Daxi District, TW
• Chin-Yuan Chang · Hsinchu, TW
• Cheng-Hung Pan · New Taipei, TW
• Mao-Sheng LIU · Taoyuan, TW
• Tzu-Tu Chao · Taoyuan, TW

Key dates

• Filing date: Mar 6, 2020
• Grant date: Feb 7, 2023
• Expiry date: Aug 30, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2889
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Herein disclosed are a method and a test probe for testing an electrical component. The electrical component comprises at least a first electrode and a second electrode. The method comprises the following steps: covering the first electrode with a first conducting flexible layer; driving a first electrode contact to electrically connect a first end of the first electrode contact with the first electrode via the first conducting flexible layer; covering the second electrode with a second conducting flexible layer; and driving a second electrode contact to electrically connect a second end of the second electrode contact with the second electrode via the second conducting flexible layer. The first conducting flexible layer is an anisotropic conductive film.