Min-Hung Chang
5Patents
1h-index
20Co-inventors
47Inventor score
Filing activity: Apr 24, 2009 → Sep 29, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7804589B2 | System and method for testing light-emitting devices | Physics | 7 | Active |
| US11841381B2 | Wafer inspection method and inspection apparatus | Physics | 0 | Active |
| US12345741B2 | Wafer inspection method and inspection apparatus | Physics | 0 | Active |
| US11047550B1 | Electronic device | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US11573265B2 | Electrical component testing method and test probe | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.