Patent · US Active

Attitude determination system

US11579240B2 · kind B2 · utility

0Cited by
20References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 2017
Grant dateFeb 14, 2023
Priority date
Expiry dateJan 16, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S3/7862
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An instrument (20) determines the attitude of a spacecraft (3) on which it is mounted, by interacting incident light (11) from the Sun with one or more light conditioning elements (12) and thereby forming a diffraction pattern at a photo-sensitive detector (13). The intensity distribution of light on the detector (13) is dependent on the angle of incidence of the light (11). An on-board computer (16) determines a direction vector to the Sun based on the light diffraction pattern detected by the detector (13).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.