Phase, phase noise, and slave mode measurement for millimeter wave integrated circuits on automatic test equipment
US11579280B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2019 |
| Grant date | Feb 14, 2023 |
| Priority date | — |
| Expiry date | Apr 27, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2223/6683
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A radar monolithic microwave integrated circuit (MMIC) includes a first transmission channel configured to output a first continuous-wave transmit signal based on a local oscillator signal having a first frequency; a first phase shifter provided on the first transmission channel and configured to apply a first phase setting to the first continuous-wave transmit signal to generate a first transmit signal having the first frequency; a first transmit monitoring signal path configured to couple out a portion of the first transmit signal from the first transmission channel as a first transmit monitoring signal; a frequency multiplier configured to receive a test signal and convert it into a multiplied test signal having a second frequency, where the first and the second frequencies are separated by a frequency offset; and a down-conversion mixer configured to mix the multiplied test signal and the first transmit monitoring signal to generate a first mixer output signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.