Patent · US Active

Methods and apparatus for absolute and relative depth measurements using camera focus distance

US11582378B2 · kind B2 · utility

0Cited by

20References

20Claims

0Family size

Assignee

Applied Materials, Inc. · US

Inventors

Ozkan Celik · Cedar Park, US
Patricia A. Schulze · Giddings, US
Gregory John Freeman · Austin, US
Paul Z. Wirth · Kalispell, US
Tommaso Vercesi · Aschaffenburg, DE

Key dates

Filing date	Jun 7, 2021
Grant date	Feb 14, 2023
Priority date	—
Expiry date	Jun 7, 2041

Classification

Technology area (CPC H)Electricity
CPC primaryH04N2013/0081
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A depth measuring apparatus includes a camera assembly configured to capture a plurality of images of a target at a plurality of distances from the target. The depth measuring apparatus further includes a controller configured to, for each of a plurality of regions within the plurality of images: determine corresponding gradient values within the plurality of images; determine a corresponding maximum gradient value from the corresponding gradient values; and determine, based on the corresponding maximum gradient value, a depth measurement for a region of the plurality of regions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.