Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof
US11585849B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2019 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Jul 30, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3177
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example apparatus includes a circuit and calibration circuitry. The circuit has complementary input ports to receive input signals including a monotonously rising and/or falling wave reference signal and a voltage-test signal to test at least one direct current (DC) voltage associated with the circuit by comparing the input signals using a first polarity and second polarity associated with the circuit to produce a first output signal and a second output signal. During operation, the circuit manifests an input voltage offset and a signal delay with each comparison of the input signals. The calibration circuitry processes the first and second output signals and, in response, calibrates or sets an adjustment for at least one signal path associated with the circuit in order to account for the input offset voltage and signal delay during normal operation of the circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.