Read retry scratch space
US11586498B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2019 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Jan 10, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Devices and techniques to recover data from a memory device using a custom Read Retry feature are disclosed herein. A memory device can receive a first read request, read data from the memory array corresponding to the read request, and determine if the read data corresponding to the first read request includes a detectable error. In response to a detected error in the received data corresponding to the first read request, the memory device can recover data corresponding to the first read request using one of a set of read retry features, and load the one of the set of read retry features used to recover data corresponding to the first read request as a custom read retry feature in the memory device for a second read request subsequent to the first read request.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.