Patent · US Active

Integrated circuit with embedded memory modules

US11587636B2 · kind B2 · utility

0Cited by

2References

8Claims

0Family size

Assignee

NXP USA, Inc. · US

Inventors

Wenbin Yang · Lo Wu, CN
Weiwei Sang · Suzhou, CN

Key dates

Filing date	Dec 15, 2021
Grant date	Feb 21, 2023
Priority date	—
Expiry date	Dec 15, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/0401
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The disclosure relates to a system and method for maintaining stability during a scan shift operation on multiple embedded memories in an integrated circuit. Examples disclosed herein include an integrated circuit comprising a plurality of memory modules and a built-in self-test controller, wherein the BIST controller and memory modules are arranged and configured to reduce toggling of cells in the memory modules during a scan shift operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.