Weiwei Sang
2Patents
1h-index
2Co-inventors
30Inventor score
Filing activity: Nov 20, 2015 → Dec 15, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9805826B2 | Method and apparatus for testing integrated circuit | Physics | 3 | Active |
| US11587636B2 | Integrated circuit with embedded memory modules | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.