Debug tool for test instruments coupled to a device under test

US11598804B2 · kind B2 · utility

Assignee

• Intel Corporation · US

Inventors

• Jesse Armagost · Portland, US
• Nathan S. Blackwell · Hillsboro, US
• Matthew Boelter · Hillsboro, US
• Geoffrey Oliver Kelly · New Berlin, US
• James Neeb · Gilbert, US
• Sundar V. PATHY · Chandler, US
• Yu Zhang · Beijing, CN
• Shelby G. ROLLINS · Hillsboro, US

Key dates

• Filing date: Mar 22, 2019
• Grant date: Mar 7, 2023
• Expiry date: Jul 6, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31905
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments described herein may be directed to receiving a plurality of data captured, respectively, by a plurality of test instruments coupled to a device under test, wherein a plurality of data elements within, respectively, the plurality of captured data are associated with a timestamp based upon a time a data element was captured. Embodiments may also analyze the received plurality of data captured, respectively, by the one or more test instruments, and graphically display at least a portion of the analyzed plurality of captured data to a user. Other embodiments may be identified herein.