James Neeb
13Patents
5h-index
21Co-inventors
66Inventor score
Filing activity: Aug 26, 1998 → Mar 22, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6163161A | Directed self-heating for reduction of system test time | Physics | 12 | Expired |
| US6766486B2 | Joint test action group (JTAG) tester, such as to test integrated circuits in parallel | Physics | 10 | Expired |
| US9400291B2 | Integrated circuit test temperature control mechanism | Physics | 10 | Active |
| US6441637B1 | Apparatus and method for power continuity testing in a parallel testing system | Electricity | 8 | Expired |
| US9869714B2 | Integrated circuit test temperature control mechanism | Physics | 8 | Active |
| US9886401B2 | Bus for communication between devices | Emerging Cross-Sectional Technologies | 4 | Active |
| US6559673B2 | Apparatus and method for power continuity testing in a parallel testing system | Electricity | 3 | Expired |
| US6621287B2 | Connector assembly with decoupling capacitors | Emerging Cross-Sectional Technologies | 2 | Expired |
| US6898852B2 | Connector assembly with decoupling capacitors | Emerging Cross-Sectional Technologies | 2 | Expired |
| US9454499B2 | Asynchronous communication between devices | Emerging Cross-Sectional Technologies | 2 | Active |
| US11193975B2 | Compressed test patterns for a field programmable gate array | Physics | 0 | Active |
| US9548284B2 | Reduced expansion thermal compression bonding process bond head | Emerging Cross-Sectional Technologies | 0 | Active |
| US11598804B2 | Debug tool for test instruments coupled to a device under test | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.