Patent · US Active

Wafer polishing head, system thereof, and method using the same

US11602821B2 · kind B2 · utility

0Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 17, 2020
Grant dateMar 14, 2023
Priority date
Expiry dateMay 8, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A wafer polishing head is provided. The wafer polishing head includes a carrier head, a plurality of piezoelectric actuators disposed on the carrier head, and a membrane disposed over the plurality of piezoelectric actuators. The plurality of piezoelectric actuators is configured to provide mechanical forces on the membrane and generate an electrical charge when receiving counterforces of the mechanical forces through the membrane. A wafer polishing system and a method for polishing a substrate using the same are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.