Back scattering inspection system and back scattering inspection method
US11614413B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jan 3, 2020 |
| Grant date | Mar 28, 2023 |
| Priority date | — |
| Expiry date | Jan 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/3303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.