Bicheng Liu
20Patents
2h-index
49Co-inventors
49Inventor score
Filing activity: Sep 28, 2016 → Jul 21, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10295679B2 | Semiconductor detector | Electricity | 3 | Active |
| US11112528B2 | Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same | Physics | 2 | Active |
| US10586324B2 | Inspection devices and methods for inspecting a container | Physics | 2 | Active |
| US10613247B2 | Method, apparatus and system for inspecting object based on cosmic ray | Physics | 2 | Active |
| US10646179B2 | Multi-energy spectrum x-ray imaging systems and methods for recognizing article using multi-energy spectrum x-ray imaging system | Human Necessities | 1 | Active |
| US10388818B2 | Semiconductor detector | Electricity | 1 | Active |
| US11346975B2 | Spiral CT device and Three-dimensional image reconstruction method | Physics | 0 | Active |
| US10670743B2 | Semiconductor detector and method for packaging the same | Emerging Cross-Sectional Technologies | 0 | Active |
| US11619599B2 | Substance identification device and method for extracting statistical feature based on cluster analysis | Physics | 0 | Active |
| US10663607B2 | Apparatuses for processing signals for a plurality of energy regions, and systems and methods for detecting radiation of a plurality of energy regions | Physics | 0 | Active |
| US10884156B2 | Image processing method, device, and computer readable storage medium | Physics | 0 | Active |
| US11812002B2 | Method and device for correcting a scanned image and image scanning system | Physics | 0 | Active |
| US10620336B2 | Method, device and system for inspecting moving object based on cosmic rays | Physics | 0 | Active |
| US10448904B2 | Decomposition method and apparatus based on basis material combination | Physics | 0 | Active |
| US11699223B2 | Image data processing method, device and security inspection system based on VR or AR | Physics | 0 | Active |
| US11055869B2 | Security inspection based on scanned images | Physics | 0 | Active |
| US10101473B2 | Semiconductor detector | Emerging Cross-Sectional Technologies | 0 | Active |
| US12298261B2 | Backscatter imaging device, control method and inspection system | Physics | 0 | Active |
| US10285252B2 | Dual-energy ray scanning system, scanning method and inspecting system | Physics | 0 | Active |
| US11614413B2 | Back scattering inspection system and back scattering inspection method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.