Sample inspection system
US11624717B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 10, 2019 |
| Grant date | Apr 11, 2023 |
| Priority date | — |
| Expiry date | Mar 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/643
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.