Paul Evans
11Patents
2h-index
5Co-inventors
43Inventor score
Filing activity: Jun 2, 2008 → Dec 13, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8462913B2 | Detection of X-ray scattering | Physics | 6 | Active |
| US9921173B2 | X-ray diffraction imaging system using debye ring envelopes | Electricity | 3 | Active |
| US9063065B2 | Sample analysis | Physics | 2 | Active |
| US10948432B2 | Sample inspection apparatus employing a diffraction detector | Physics | 2 | Active |
| US11624717B2 | Sample inspection system | Physics | 1 | Active |
| USD1042421S1 | Communication device | General | 1 | Active |
| US11971371B2 | Sample inspection system comprising a beam former to project a polygonal shell beam | Physics | 0 | Active |
| US12181427B1 | X-ray system | Physics | 0 | Active |
| USD995500S1 | Communication device | General | 0 | Active |
| US11467104B2 | Sample inspection apparatus employing a diffraction detector | Physics | 0 | Active |
| US11726048B2 | Sample inspection apparatus employing a diffraction detector | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.