Allophone inspection device and inspection method thereof
US11636717B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 3, 2020 |
| Grant date | Apr 25, 2023 |
| Priority date | — |
| Expiry date | Sep 10, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04R2430/21
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
An allophone inspection device and inspection method thereof are provided. An allophone inspection device includes an array microphone unit in which a plurality of array microphones are disposed at predetermined intervals, and a controller configured to build reference data by quantifying analyzed allophone by collecting sound signals generated from surrounding based on a position where the array microphone unit is installed in advance and measure a surrounding sound signal through the array microphone unit to estimate whether or not noise is generated and a position of the sound source where the noise is generated based on the reference data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.