Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast
US11645792B2 · kind B2 · utility
1Cited by
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9Claims
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Key dates
| Filing date | Dec 18, 2020 |
| Grant date | May 9, 2023 |
| Priority date | — |
| Expiry date | Dec 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/461
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.