Inventor · Dublin, CA, US

Lars Omlor

18Patents
3h-index
41Co-inventors
52Inventor score

Filing activity: Oct 9, 2015 → Mar 8, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US10706562B2 Motion-measuring system of a machine and method for operating the motion-measuring system Physics 8 Active
US9797804B2 Method and system for determining the spatial structure of an object Physics 7 Active
US10568503B2 Optical coherence tomography for performing measurements on the retina Physics 4 Active
US11645792B2 Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast Physics 1 Active
US10935372B2 Device and method for measuring a surface topography, and calibration method Physics 1 Active
US10755429B2 Apparatus and method for capturing images using lighting from different lighting angles Physics 1 Active
US11371828B2 Coordinate measuring machine and method for measuring coordinates of a workpiece Physics 1 Active
US12271115B2 Method to detect a defect on a lithographic sample and metrology system to perform such a method Physics 0 Active
US12303197B2 Patient tuned ophthalmic imaging system with single exposure multi-type imaging, improved focusing, and improved angiography image sequence display Physics 0 Active
US11442263B2 Method and devices for displaying stereoscopic images Electricity 0 Active
US11972511B2 Accessible neural network image processing workflow Physics 0 Active
US12033343B2 Stereoscopy method and stereoscopy apparatus Electricity 0 Active
US11633918B2 Method and device for additive manufacturing utilizing simulation test results of a workpiece Emerging Cross-Sectional Technologies 0 Active
US11504855B2 System, method and marker for the determination of the position of a movable object in space Physics 0 Active
US11821860B2 Optical three-dimensional scanning for collision avoidance in microscopy system Physics 0 Active
US12033280B2 Method and apparatus for generating a 3D reconstruction of an object Physics 0 Active
US12372347B2 Device and method for measuring a surface topography, and calibration method Physics 0 Active
US11803045B2 3D calibration body, calibration method for the spatial calibration of an optical imaging system, calibration element and calibration method for calibrating an optical imaging system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.