Patent · US Active

Method and apparatus for determining malfunction, and sensor system

US11662443B2 · kind B2 · utility

0Cited by

2References

19Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Franz Michael Darrer · Graz, AT
Martin Graefling · Graz, AT
Boris KIRILLOV · Graz, AT
Stefan Mendel · Graz, AT
Christoph Steiner · Sankt Margarethen an der Raab, AT

Key dates

Filing date	Jun 24, 2020
Grant date	May 30, 2023
Priority date	—
Expiry date	Mar 5, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01S17/931
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for determining malfunction is provided. The method includes receiving a 1D or 2D luminance image of a scene from a time-of-flight based 3D-camera. The luminance image includes one or more pixels representing intensities of background light received by an image sensor of the 3D-camera. The method further includes receiving a 2D optical image of the scene from an optical 2D-camera and comparing the luminance image to the optical image. If the luminance image does not match the optical image, the method additionally includes determining malfunction of one of the 3D-camera and the 2D-camera.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.