Patent · US Active

DC plasma control for electron enhanced material processing

US11664195B1 · kind B1 · utility

6Cited by
21References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 11, 2021
Grant dateMay 30, 2023
Priority date
Expiry dateNov 11, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H2242/22
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Systems and methods for material processing using wafer scale waves of precisely controlled electrons in a DC plasma is presented. The anode and cathode of a DC plasma chamber are respectively connected to an adjustable DC voltage source and a DC current source. The anode potential is adjusted to shift a surface floating potential of a stage in a positive column of the DC plasma to a reference ground potential of the DC voltage/current sources. A control loop can be activated throughout various processing steps to maintain the surface floating potential of the stage to the reference ground potential. A signal generator referenced to the ground potential is capacitively coupled to the stage to control a surface potential at the stage for provision of kinetic energy to free electrons in the DC plasma.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.