System and method for efficiently scoring probes in an image with a vision system
US11676301B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 7, 2020 |
| Grant date | Jun 13, 2023 |
| Priority date | — |
| Expiry date | Nov 30, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.