Self diagnostic apparatus for electronic device
US11686772B2 · kind B2 · utility
0Cited by
2References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 7, 2021 |
| Grant date | Jun 27, 2023 |
| Priority date | — |
| Expiry date | Dec 14, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a self-diagnostic apparatus capable of improving safety of a device under test (DUT) by analyzing a characteristic change of a DUT, such as a semiconductor, a circuit module, or a system, in a safe operating region over time and allowing a regular test and a periodic test to be performed even while the DUT is running.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.