Patent · US Active

Method and system for fabrication of a vertical fin-based field effect transistor

US11735671B2 · kind B2 · utility

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12Claims
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Key dates

Filing dateApr 12, 2022
Grant dateAug 22, 2023
Priority date
Expiry dateApr 12, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/64

Abstract

A method of fabricating a vertical fin-based field effect transistor (FET) includes providing a semiconductor substrate having a first surface and a second surface, the semiconductor substrate having a first conductivity type, epitaxially growing a first semiconductor layer on the first surface of the semiconductor substrate, the first semiconductor layer having the first conductivity type and including a drift layer and a graded doping layer on the drift layer, and epitaxially growing a second semiconductor layer having the first conductivity type on the graded doping layer. The method also includes forming a metal compound layer on the second semiconductor layer, forming a patterned hard mask layer on the metal compound layer, and etching the metal compound layer and the second semiconductor layer using the patterned hard mask layer as a mask exposing a surface of the graded doping layer to form a plurality of fins surrounded by a trench.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.