Programmable scan chain debug technique
US11754624B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 2022 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Apr 30, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31921
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes injecting scan patterns into an input of a decompressor that distributes the scan patterns to a plurality of scan chains whose outputs are coupled to inputs of a compressor, which provides a compressed scan test result representing the plurality of scan chains. The method also includes, in response to the compressed scan test result being indicative of failure, identifying a particular scan chain of the plurality of scan chains that is responsible for the failure by a debug circuit that is coupled to the input of the decompressor and to a compressor output. The debug circuit enables an output of any single scan chain of the plurality of scan chains to be available at the compressor output while suppressing outputs of all other scan chains of the plurality of scan chains.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.