Komal Shah
5Patents
2h-index
9Co-inventors
40Inventor score
Filing activity: Jun 30, 2011 → Feb 24, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10685730B1 | Circuit including efficient clocking for testing memory interface | Physics | 5 | Active |
| US8738978B2 | Efficient wrapper cell design for scan testing of integrated | Physics | 3 | Active |
| US8898527B2 | At-speed scan testing of clock divider logic in a clock module of an integrated circuit | Physics | 1 | Active |
| US10459029B2 | On-chip clock control monitoring | Physics | 1 | Active |
| US11754624B1 | Programmable scan chain debug technique | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.