Method and apparatus for identifying sample position in atomic force microscope
US11761981B2 · kind B2 · utility
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2References
16Claims
0Family size
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Key dates
| Filing date | Dec 24, 2021 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Jan 26, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B13/027
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and a method for identifying a sample position in an atomic force microscope according to an exemplary embodiment of the present disclosure are provided. The method for identifying a sample position in an atomic force microscope includes receiving a vision image including a subject sample through a vision unit; determining a subject sample region in the vision image using a prediction model which is configured to output the subject sample region by receiving the vision image as an input; and determining a position of the subject sample based on the subject sample region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.