PARK SYSTEMS CORP.
17Patents
17Active
17Granted
62Portfolio score
Filing activity: Nov 1, 2006 → Jan 30, 2023 · 6 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8099793B2 | Scanning probe microscope with automatic probe replacement function | Physics | 10 | Active |
| US7709791B2 | Scanning probe microscope with automatic probe replacement function | Physics | 5 | Active |
| US7644447B2 | Scanning probe microscope capable of measuring samples having overhang structure | Emerging Cross-Sectional Technologies | 3 | Active |
| US7514679B2 | Scanning probe microscope for measuring angle and method of measuring a sample using the same | Physics | 1 | Active |
| US12399195B2 | Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method | Physics | 0 | Active |
| US10133052B2 | Image acquiring method and image acquiring apparatus using the same | Physics | 0 | Active |
| US8209766B2 | Scanning probe microscope capable of measuring samples having overhang structure | Emerging Cross-Sectional Technologies | 0 | Active |
| US11959852B2 | Method for determining properties of a sample by ellipsometry | Physics | 0 | Active |
| US9645169B2 | Measurement apparatus and method with adaptive scan rate | Physics | 0 | Active |
| US9645168B2 | Head limiting movement range of laser spot and atomic force microscope having the same | Performing Operations; Transporting | 0 | Active |
| US11619649B1 | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same | Physics | 0 | Active |
| US12038455B2 | Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source | Physics | 0 | Active |
| US11175308B2 | Chip carrier exchanging device and atomic force microscopy apparatus having same | Physics | 0 | Active |
| US11761981B2 | Method and apparatus for identifying sample position in atomic force microscope | Physics | 0 | Active |
| US11598788B2 | Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source | Physics | 0 | Active |
| US9081272B2 | Leveling apparatus and atomic force microscope including the same | Physics | 0 | Active |
| US8402560B2 | Scanning probe microscope with drift compensation | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.