Patent · US Active

Apparatus for monitoring a focal state of microscope

US11774740B2 · kind B2 · utility

0Cited by

7References

24Claims

0Family size

Assignee

ABBERIOR INSTRUMENTS GMBH · DE

Inventors

Joachim Fischer · Rodgau, DE
Matthias Henrich · Frankfurt am Main, DE
Winfried Willemer · Bovenden, DE

Key dates

Filing date	May 22, 2020
Grant date	Oct 3, 2023
Priority date	—
Expiry date	Sep 24, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/364
WIPO fieldOptics
WIPO sectorInstruments

Abstract

An apparatus is provided for monitoring a focal state of a microscope having an object plane and a main imaging area. The apparatus has an auxiliary light source providing an auxiliary light beam and coupling the auxiliary light beam into the microscope in such a way that the coupled auxiliary light beam runs within a plane which is spanned outside of the main imaging area by a straight line running in the object plane and a normal to the object plane, and that the coupled auxiliary light beam is inclined at an angle to a normal to the object plane. A part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on a registration device in an area of incidence. The registration device registers position changes of the area of incidence on the registration device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.