Patent · US Active

Circuits for power down leakage reduction in random-access memory

US11790982B2 · kind B2 · utility

0Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 27, 2021
Grant dateOct 17, 2023
Priority date
Expiry dateNov 5, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C5/025
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention discloses a wordline driver circuit for a random-access memory (RAM), which can reduce leakage during power down mode. The circuit includes a pre-driver stage on header and footer. The pre-driver stage includes a strap buffer defining a header and comprising a first switch connecting a first set of wordlines to a first voltage. The pre-driver stage includes an input-output buffer defining a footer and comprising a second switch connecting a second set of wordlines to a second voltage. In the pre-driver stage, the strap buffer further includes a third switch connecting the second set of wordlines to the first voltage and a fourth switch connecting the first set of wordlines to the second voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.