Patent · US Active

Mechanical alignment of x-ray sources

US11800625B2 · kind B2 · utility

0Cited by

1References

14Claims

0Family size

Assignee

Excillum AB · SE

Inventors

Johan Kronstedt · Sollentuna, SE
Ulf Lundström · Sollentuna, SE
Per Takman · Sollentuna, SE

Key dates

Filing date	Nov 4, 2019
Grant date	Oct 24, 2023
Priority date	—
Expiry date	Aug 5, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH05G2/007
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

X-ray sources including an electron source, an adjustment means for adjusting an orientation of the electron beam generated by the electron source, a focusing means configured to focus the electron beam in accordance with a focusing setting, a beam orientation sensor arranged to generate a signal indicating an orientation of the electron beam relative to a target position, and a controller that is operably connected to the focusing means, the beam orientation sensor and the adjustment means. Also, X-ray sources including a target orientation sensor and a target adjustment means, wherein the controller is configured to cause the beam adjustment means and/or target adjustment means to adjust the relative orientation between the electron beam and the target.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.