Apparatus and method for controlling unit specific junction temperature with high temporal resolution for concurrent central processing unit (CPU) core testing
US11808813B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Mar 11, 2022 |
| Grant date | Nov 7, 2023 |
| Priority date | — |
| Expiry date | Mar 11, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus includes a processor configured to control an automatic test equipment (ATE) to measure one or more parameters of a current test instance for testing a device under test (DUT), during execution of the current test instance on the DUT, and determine, based on the measured one or more parameters, one or more controls for controlling a temperature of a thermal head connected to the DUT so that a junction temperature of the DUT corresponds to a predetermined test temperature. The processor is further configured to control the temperature of the thermal head, based on the determined one or more controls.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.