Learning tree output node selection using a measure of node reliability
US11810003B2 · kind B2 · utility
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Inventors
Key dates
| Filing date | Mar 14, 2018 |
| Grant date | Nov 7, 2023 |
| Priority date | — |
| Expiry date | Apr 19, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An information processing device generates a prediction output corresponding to input data. The information processing device includes input-node specification processor circuitry, based on the input data, configured to specify input nodes corresponding to the input data and each located on a corresponding one of layers from beginning to end of the learning tree structured, reliability-index acquisition processor circuitry configured to acquire a reliability index obtained through the predetermined learning processing and indicating prediction accuracy, output-node specification processor circuitry, based on the reliability index acquired by the reliability-index acquisition processor circuitry configured to specify, from the input nodes corresponding to the input data, an output node that is the basis of the generation of a prediction output, and prediction-output generation processor circuitry configured to generate a prediction output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.