Inventor · Iwate, JP

Yasuhiro Sugawara

20Patents
8h-index
61Co-inventors
78Inventor score

Filing activity: Oct 25, 1991 → Aug 12, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US5289004A Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light Emerging Cross-Sectional Technologies 93 Expired
US5296729A Semiconductor memory device having static random access memory Emerging Cross-Sectional Technologies 39 Expired
US6097197A Scanning probe microscope Emerging Cross-Sectional Technologies 20 Expired
US6507026B2 Planar X-ray detector Emerging Cross-Sectional Technologies 19 Expired
US6576946B1 Semiconductor device comprising capacitor cells, bit lines, word lines, and MOS transistors in a memory cell area over a semiconductor substrate Electricity 13 Expired
US6544834B1 Method of forming a semiconductor device including a capacitor with tantalum oxide (Ta2O5) Electricity 13 Expired
US5655067A Animation generating method in a design supporting system Physics 11 Expired
US6724855B2 X-ray flat panel detector Electricity 11 Expired
US6524927B1 Semiconductor device and method of fabricating the same Electricity 7 Expired
US6717202B2 HSG semiconductor capacitor with migration inhibition layer Electricity 5 Expired
US6583463B1 Semiconductor integrated circuit device with information storage capacitor having ruthenium dioxide lower electrode and crystallized TA2O5 capacitor insulator Electricity 4 Expired
US6713343B2 Method of forming a semiconductor device with a capacitor including a polycrystalline tantalum oxide film dielectric Electricity 2 Expired
US10178977B2 X-ray diagnostic apparatus and image processing apparatus Physics 2 Active
US6627497B2 Semiconductor integrated circuit device and method of manufacturing the same Electricity 2 Expired
US9978163B2 Exposure management system Physics 1 Active
US8351346B2 Communication device Emerging Cross-Sectional Technologies 1 Active
US12336850B2 X-ray diagnostic apparatus and tomosynthesis imaging method Physics 0 Active
US11835548B2 Vibration component measurement device, Kelvin probe force microscope, and vibration component measurement method Physics 0 Active
US12208935B2 Wrap replacing apparatus Human Necessities 0 Active
US11810003B2 Learning tree output node selection using a measure of node reliability Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.