Optical three-dimensional scanning for collision avoidance in microscopy system
US11821860B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
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Key dates
| Filing date | Oct 14, 2020 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Jan 25, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/418
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A collision avoidance system and method for an x-ray CT microscope processes image data of an object at different angles and generates a model of the object. This model is then used to configure the microscope for operation and possibly avoid collisions between the microscope and the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.