Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones
US11828795B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2022 |
| Grant date | Nov 28, 2023 |
| Priority date | — |
| Expiry date | Oct 21, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318513
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein are thermal heads and corresponding test systems for independently controlling a one or more components while testing one or more devices under test. In some embodiments, a thermal head comprises a plurality of adapters, one or more heaters, and one or more thermal controllers for independently controlling temperatures of the components. The thermal controllers may control the temperatures of at least some of the components independently such that thermal control of one component does not affect the thermal control of the other component. In some embodiments, the thermal control is by way of one or more cold plates, and the thermal head comprises one or more cold plates. Embodiments of the disclosure further include independent control of one or more forces using one or more force mechanisms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.