Samer Kabbani
47Patents
9h-index
56Co-inventors
78Inventor score
Filing activity: Jan 8, 1999 → Apr 22, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6678583B2 | Robotic storage buffer system for substrate carrier pods | Electricity | 78 | Expired |
| US7626407B2 | Miniature fluid-cooled heat sink with integral heater | Electricity | 52 | Active |
| US7336197B2 | LED lighting system for line scan camera based multiple data matrix scanners | Physics | 44 | Active |
| US7355428B2 | Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing | Physics | 41 | Expired |
| US6540833B1 | Moving head coating apparatus and method | Performing Operations; Transporting | 21 | Expired |
| US11493551B2 | Integrated test cell using active thermal interposer (ATI) with parallel socket actuation | Physics | 20 | Active |
| US7160389B2 | System and method for cleaning and priming an extrusion head | Performing Operations; Transporting | 12 | Expired |
| US6387184B1 | System and method for interchangeably interfacing wet components with a coating apparatus | Performing Operations; Transporting | 9 | Expired |
| US11674999B2 | Wafer scale active thermal interposer for device testing | Physics | 9 | Active |
| US11567119B2 | Testing system including active thermal interposer device | Physics | 8 | Active |
| US11573262B2 | Multi-input multi-zone thermal control for device testing | Physics | 5 | Active |
| US11693051B1 | Thermal head for independent control of zones | Physics | 5 | Active |
| US11656272B1 | Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones | Physics | 5 | Active |
| US7169229B2 | Moving head, coating apparatus | Performing Operations; Transporting | 4 | Expired |
| US6488041B1 | System and method for clean and priming extrusion head | Performing Operations; Transporting | 4 | Expired |
| US11587640B2 | Carrier based high volume system level testing of devices with pop structures | Physics | 3 | Active |
| US11828795B1 | Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones | Physics | 3 | Active |
| US11796589B1 | Thermal head for independent control of zones | Electricity | 3 | Active |
| US9557375B2 | Group vision alignment for double sided IC device testing | Physics | 2 | Active |
| US7700891B2 | Process for handling semiconductor devices and transport media in automated sorting equipment | Electricity | 2 | Active |
| US11852678B2 | Multi-input multi-zone thermal control for device testing | Physics | 2 | Active |
| US11821913B2 | Shielded socket and carrier for high-volume test of semiconductor devices | Physics | 2 | Active |
| US8040145B2 | Miniature fluid-cooled heat sink with integral heater | Electricity | 2 | Active |
| US11754620B2 | DUT placement and handling for active thermal interposer device | Physics | 1 | Active |
| US11742055B2 | Carrier based high volume system level testing of devices with pop structures | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.