Patent · US Active

Microscope and method for determining a measuring location of a microscope

US11830215B2 · kind B2 · utility

0Cited by

2References

18Claims

0Family size

Assignee

Carl Zeiss Microscopy GmbH · DE

Inventors

Manuel Amthor · Jena, DE
Daniel Haase · Zöllnitz, DE
Michael Gögler · Wolfratshausen, DE

Key dates

Filing date	Jan 15, 2021
Grant date	Nov 28, 2023
Priority date	—
Expiry date	Mar 27, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30244
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

An overview image of a sample carrier is obtained in a method for ascertaining a measurement location of a microscope. A mapping or homography is determined, by means of which the overview image is perspectively convertible into a plan view image on the basis of a height of the sample carrier. The measurement location is identified, with the aid of the determined mapping/homography, in the overview image or in an output image derived therefrom.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.