Robot arm device and method for transferring wafer
US11837484B2 · kind B2 · utility
0Cited by
8References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 12, 2021 |
| Grant date | Dec 5, 2023 |
| Priority date | — |
| Expiry date | Jul 10, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2697
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes positioning an end effector at a height lower than a height of a wafer. The end effector is moved to a position under the wafer. A wafer backside property of the wafer is detected by using a sensor on the end effector. The wafer backside property is analyzed to obtain an analysis result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.