Patent · US Active

Chemical mechanical planarization pads via vat-based production

US11845157B2 · kind B2 · utility

0Cited by
1References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 7, 2020
Grant dateDec 19, 2023
Priority date
Expiry dateOct 6, 2041

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC08L75/04
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A chemical mechanical polishing (CMP) pad includes a polishing portion formed using a vat-based additive manufacturing process. The polishing portion includes a polymer material with a first elastic modulus. In some embodiments the polishing portion is disposed on the backing portion. The backing portion may have a second elastic modulus. The second elastic modulus may be less than the first elastic modulus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.