CMC Materials LLC
29Patents
29Active
29Granted
52Portfolio score
Filing activity: Jan 30, 2015 → Mar 1, 2024
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10920107B2 | Self-stopping polishing composition and method for bulk oxide planarization | Electricity | 1 | Active |
| US11802220B2 | Silica-based slurry for selective polishing of carbon-based films | Electricity | 0 | Active |
| US10946495B2 | Low density polishing pad | Chemistry; Metallurgy | 0 | Active |
| US11807710B2 | UV-curable resins used for chemical mechanical polishing pads | Chemistry; Metallurgy | 0 | Active |
| US11855258B2 | Secondary battery cell with solid polymer electrolyte | Emerging Cross-Sectional Technologies | 0 | Active |
| US11851584B2 | Alternative oxidizing agents for cobalt CMP | Electricity | 0 | Active |
| US11938584B2 | Chemical mechanical planarization pads with constant groove volume | Chemistry; Metallurgy | 0 | Active |
| US12428580B2 | CMP composition including an anionic abrasive | Electricity | 0 | Active |
| US11492514B2 | Derivatized polyamino acids | Chemistry; Metallurgy | 0 | Active |
| US11629271B2 | Titanium dioxide containing ruthenium chemical mechanical polishing slurry | Electricity | 0 | Active |
| US12234382B2 | CMP composition including anionic and cationic inhibitors | Electricity | 0 | Active |
| US10968366B2 | Composition and method for metal CMP | Electricity | 0 | Active |
| US11845156B2 | Polishing pad employing polyamine and cyclohexanedimethanol curatives | Chemistry; Metallurgy | 0 | Active |
| US12227673B2 | Composition and method for silicon nitride CMP | Chemistry; Metallurgy | 0 | Active |
| US11384253B2 | Dual additive composition for polishing memory hard disks exhibiting edge roll off | Physics | 0 | Active |
| US10968377B2 | Chemical-mechanical processing slurry and methods for processing a nickel substrate surface | Chemistry; Metallurgy | 0 | Active |
| US11637317B2 | Solid polymer electrolyte compositions and methods of preparing same | Emerging Cross-Sectional Technologies | 0 | Active |
| US11440158B2 | Coated compressive subpad for chemical mechanical polishing | Performing Operations; Transporting | 0 | Active |
| US11043151B2 | Surface treated abrasive particles for tungsten buff applications | Electricity | 0 | Active |
| US11034862B2 | Polishing composition and method utilizing abrasive particles treated with an aminosilane | Electricity | 0 | Active |
| US11597854B2 | Method to increase barrier film removal rate in bulk tungsten slurry | Chemistry; Metallurgy | 0 | Active |
| US10988635B2 | Composition and method for copper barrier CMP | Electricity | 0 | Active |
| US12398293B2 | Composition and method for polishing boron doped polysilicon | Chemistry; Metallurgy | 0 | Active |
| US11845157B2 | Chemical mechanical planarization pads via vat-based production | Chemistry; Metallurgy | 0 | Active |
| US11725116B2 | CMP composition including a novel abrasive | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.