High-density resistive random-access memory array with self-aligned bottom electrode contact
US11856878B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2021 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Aug 5, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N70/8833
Abstract
A high-density resistive random-access memory array with self-aligned bottom electrode contact includes a plurality of electrically conductive structures embedded in an interconnect dielectric material layer, a bottom electrode selectively grown over, and electrically connected to, each of the electrically conductive structures with the bottom electrode above an electrically conductive structure being separated from the bottom electrode above another electrically conductive structure by a first dielectric filling layer, the bottom electrode having a semi-circular shape. The array further includes a resistive random-access memory pillar disposed above the bottom electrode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.