Patent · US Active

Inspection program editing environment with automatic transparency operations for occluded workpiece features

US11860602B2 · kind B2 · utility

1Cited by
23References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 10, 2018
Grant dateJan 2, 2024
Priority date
Expiry dateDec 11, 2041

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a user interface with a simulation portion (e.g., including a 3D view of a workpiece) and an editing user interface portion (e.g., including an editable plan representation of a current workpiece feature inspection plan). Transparency operations are performed including automatically identifying as a target feature a workpiece feature in the 3D view that corresponds to a workpiece feature or inspection operation representation in the editable plan representation that is indicated by a current feature-directed operation (e.g., a selection operation for selecting a workpiece feature or inspection operation in the editable plan representation). An occluding workpiece feature that would otherwise be occluding at least a portion of the target feature in the 3D view is then automatically rendered as at least partially transparent in the 3D view.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.