Patent · US Active

Measurement apparatus and measurement method

US11867809B2 · kind B2 · utility

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10Claims
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Key dates

Filing dateJul 6, 2020
Grant dateJan 9, 2024
Priority date
Expiry dateApr 15, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S17/34
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement apparatus includes a laser apparatus, a branching part that branches a frequency-modulated laser beam output by the laser apparatus into a reference light and a measurement light; a beat signal generation part that generates a beat signal by mixing a reflected light and the reference light, a conversion part that converts the beat signal into a digital signal at a first sampling rate and frequency-analyses it, an extraction part that extracts a signal component corresponding to a cavity frequency from the frequency-modulated laser beam, a digital filter that digitally filters the extracted signal component at a second sampling rate; and a calculation part that calculates a difference in a propagation distance between the reference light and the measurement light.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.